The future of IC design, testing, and manufacturing
نویسنده
چکیده
For at least last 30 years microelectronics has been evolving rapidly tracking almost without a single deviation Moore’s Law [3]. Such spectacular progress has been driven by the development of better technologies using constantly improved, but also more expensive, manufacturing equipment. Design and test have followed, struggling with technology-enabled performance opportunities and technologygenerated complexity.
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عنوان ژورنال:
- IEEE Design & Test of Computers
دوره 13 شماره
صفحات -
تاریخ انتشار 1996